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SE1750
The SE1750 is an advanced Digital Sampling Oscilloscope (DSO) with Clock Data Recovery (CDR) capabilities. It performs precise eye-diagram analysis at 32 GHz or 50 GHz to assess transmitter and receiver quality, using statistical under-sampling techniques. Equipped with comprehensive software libraries, it supports eye measurements, jitter analysis, and NRZ/PAM4 data processing.
Electrical Specifications
Parameter | Symbol | Condition | Min | Typ | Max | Unit |
|---|---|---|---|---|---|---|
CDR Sensitivity | 100 | mV | ||||
CDR LBW | 10 | MHz | ||||
Spurious-Free Dynamic Range (sine wave) | SFDR | -58 dBc at 10 GHz, 50 mVpp, 1 GS/s
-53 dBc at 30 GHz, 50 mVpp, 1 GS/s | ||||
Memory depth | 256K | Samples | ||||
Power rating | 1.6A @12Vdc | |||||
Return Loss | 20 GHz | -15 | dB |
Notes
1. Intrinsic Jitter is the additional jitter uncertainty of the DSO as the statistical sum of the sampler, the timing generator, and DSO interconnect.
2. Related to calibration time @600mV input over the operating temperature range.
3. For all measurements that require pattern lock. For all other measurements, the SE1732 supports up to PRBS 31.
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